Workshop on Recent Advances in Biometrics and its Applications | 2020 43th Int. Conference on Telecommunications and Signal Processing (TSP) | IEEE R8| IEEE

Biometrics - TSP 2020


Artificial Intelligence



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The 4th International Workshop on Recent Advances in Biometrics and its Applications
July 7-9, 2020, Milan, Italy
https://tsp.vutbr.cz/documents/TSP2020_CFP_WS3_v3.pdf
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Biometric recognition has become a burgeoning research area due to the industrial and government needs for recognition, security and privacy concerns. It has also become center of focus for many authentication and identification applications in the civil and forensic fields. Within the framework of the 2020 43rd International Conference on Telecommunications and Signal Processing (TSP) held during July 7-9, 2020 in Milan, Italy, we invite you to the 4th International Workshop on Recent Advances in Biometrics and its Applications. The goal of this workshop is to present and discuss the recent fundamental and applied research works, providing novel solutions to challenging problems in biometrics. It is an opportunity to bring researchers and experts together to discuss the current and future state of biometrics and possible areas of further cooperation.
Topics of interest include, but are not limited to, the following:
- Biometrics based authentication and identification
- Physiological and behavioral biometrics
- Signal, image and video processing in biometrics
- Machine learning in biometrics
- Artificial intelligence in biometrics
- Fusion techniques in biometrics
- Soft biometrics
- Multimodal biometrics
- Biometric security and privacy
- Big data challenges in biometrics
- Related applications
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Important Dates
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Paper Submission Deadline: March 9, 2020
Notification of Acceptance: April 15, 2020
Final Paper Submission: April 30, 2020
Authors' Registration: May 20, 2020
Conference/workshop: July 1-3, 2020
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Proceedings
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All the accepted papers will be published in the conference proceedings issued online, which (containing only presented papers at the conference) will be submitted for indexing to the IEEE Xplore® Digital Library – IEEE Conference Record #49548, Conference Proceedings Citation Index (CPCI) of Thomson Reuters (formerly ISI Proceedings), SCOPUS, DBLP, and Google Scholar databases.
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Special Journal Issue
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Selected high-quality papers will be invited for publication in a Special Issue on “Advanced Machine Learning Algorithms for Biometrics and its Applications” in Applied Science journal (SJR Q1 in Engineering, IF: 2.217).
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Editorial Board
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Assoc. Prof. Dr. Larbi Boubchir — LIASD - University of Paris 8, France (Editor-in-Chief, larbi.boubchir@ai.univ-paris8.fr)
Prof. Boubaker Daachi — LIASD - University of Paris 8, France (bd@ai.univ-paris8.fr)